NT9100 Wyko Optical Profilometer

Location: 
ANFF-SA Node
Uni SA Mawson Lakes
Process type: 
Analytical - Optical Profilometry (non contact)
Process summary: 

Coherence scanning interferometry for fast, accurate and repeatible output, measures step heights, roughness and surface topography of components from sub nanometer to millimeter-high steps in the z dimension, motorized stage allows high resolution large field view using data stitching option

Marquee: 
Yes
Operational Status: 
Operational
NT9100 Wyko Optical Profilometer
NT9100 Wyko Optical Profilometer