JEOL JSM-6610 SEM

Location: 
Bluglass Ltd
Silverwater
Process type: 
Microscopy - Scanning Electron Microscopy (SEM-FIB/FEG)
Process summary: 

High-performance scanning electron microscopes for fast characterization and imaging of fine structures

Marquee: 
Yes
Operational Status: 
Operational

The JSM-6010PLUS/LV is a high performance, fast imaging microscope with adjustable high and low settings, secondary electron imaging and three types of backcatteredelectron imaging