DI3000 AFM

Location: 
ANFF-NSW Node
Lab 1
Process type: 
Microscopy - Atomic Force Microscopy (AFM)
Process summary: 

Atomic Force Miscroscopy. most hard materials. single chip or wafer. 20nm imaging capability; max scan area 80um x 80um

Marquee: 
Yes
Operational Status: 
Operational

See ANFF-NSW Website for Further Information