Cascade probe station with Keithley semiconductor characterisation electronics

Location: 
ANFF-NSW Node
Lab 1
Process type: 
Device Performance - Device Contacting
Process summary: 

Electrical device characterisation. Electronic devices/materials. Single chip or wafer up to 150mm. DC and RF probes available. 5um resolution on wafer positioning

Marquee: 
Yes
Operational Status: 
Operational

See ANFF-NSW Website for Further Information