Aspex PSEM eXpress Benchtop Scanning Electron Microscope

Location: 
ANFF-SA Node
Uni SA Mawson Lakes
Process type: 
Microscopy - Scanning Electron Microscopy (SEM-FIB/FEG)
Process summary: 

High vacuum for conducting (or coated) samples or fixed variable pressure for non-metallic samples, large stage allows travel of up to 80mm by 120mm and a magnification to 40,000x

Marquee: 
Yes
Operational Status: 
Operational
Aspex PSEM eXpress Benchtop Scanning Electron Microscope
Aspex PSEM eXpress Benchtop Scanning Electron Microscope